US Patent Issued to RENESAS ELECTRONICS on May 27 for "Semiconductor device and lock step startup control method for semiconductor device" (Japanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,145, issued on May 27, was assigned to RENESAS ELECTRONICS Corp. (Tokyo).

"Semiconductor device and lock step startup control method for semiconductor device" was invented by Kiyoshi Hayase (Tokyo), Yuki Hayakawa (Tokyo), Toshiyuki Kaya (Tokyo), Kyohei Yamaguchi (Tokyo), Takahiro Irita (Tokyo) and Shinichi Shibahara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes first and second processor cores configured to perform a lock step operation and including first and second scan chains. The semiconductor device further includes a scan test control unit that controls a scan test of the first and second processor cores...