US Patent Issued to RENESAS ELECTRONICS on March 18 for "Semiconductor device, debug system, and debug method" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,561, issued on March 18, was assigned to RENESAS ELECTRONICS Corp. (Tokyo).

"Semiconductor device, debug system, and debug method" was invented by Masahide Matsumoto (Tokyo), Kazunori Ochiai (Tokyo) and Tomoyoshi Ujii (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to one embodiment, a semiconductor device includes a first chip and a second chip arranged on a substrate, the first chip outputs first time stamp data and first trace data in which a time stamp value is associated with a first execution result obtained by executing software, the second chip outputs second trace data in which a difference value with a marker is associated...