ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,313, issued on June 24, was assigned to RENESAS ELECTRONICS Corp. (Tokyo).
"Electrical testing method for semiconductor device" was invented by Osamu Mizoguchi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electrical test of a semiconductor device is conducted by electrically connecting a plurality of leads of the semiconductor device with a plurality of electrodes of a test board via a plurality of socket terminals of a socket of a test apparatus, respectively. At least a part of the socket is disposed inside a chamber of the test apparatus, and the test board is disposed outside the chamber. The semiconductor device is to be cooled by a...