US Patent Issued to REDLEN TECHNOLOGIES on July 15 for "Systems and methods for K-edge-based X-ray imaging having improved contrast-to-noise ratio" (Canadian Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,060, issued on July 15, was assigned to REDLEN TECHNOLOGIES INC. (Saanichton, Canada).

"Systems and methods for K-edge-based X-ray imaging having improved contrast-to-noise ratio" was invented by Krzysztof Iniewski (Port Moody, Canada), Olivier Tousignant (Brentwood Bay, Canada) and Elmaddin Guliyev (Vancouver, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of X-ray imaging includes determining energies of photons emitted by an X-ray source and attenuated by an object that are detected by an energy-discriminating radiation detector, generating photon count data by counting a number of detected photons in a plurality of energy bins of...