ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,007, issued on Sept. 23, was assigned to REALTEK SEMICONDUCTOR Corp. (Hsinchu, Taiwan).
"Ramp signal calibration device" was invented by Yen-Wei Liu (Hsinchu, Taiwan), Tsung-Yen Tsai (Hsinchu, Taiwan) and Wen-Hau Yang (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A ramp signal calibration device includes a ramp generator circuit, a detector circuitry, and a calibration circuit. The ramp generator circuit is configured to output a ramp signal according to a set signal and a calibration signal. The detector circuitry is configured to detect the ramp signal or at least one pulse signal associated with the ramp signal, in order to gen...