ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,296, issued on Sept. 23, was assigned to REALTEK SEMICONDUCTOR Corp. (Hsinchu, Taiwan).
"Circuit for testing memories" was invented by Sheng-Lin Lin (Hsinchu, Taiwan) and Shih-Chieh Lin (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit for testing a memory is provided. An input end of the memory is coupled to a register, and the circuit for testing the memory transmits data to the memory through the register. The circuit for testing the memory performs the following operations sequentially: writing a first data into a target address of the memory, all bits of the target address being at the same level, and all bits of the fi...