US Patent Issued to REALTEK SEMICONDUCTOR on June 3 for "Test device for testing on-chip clock controller having debug function" (Taiwanese Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,847, issued on June 3, was assigned to REALTEK SEMICONDUCTOR Corp. (Hsinchu, Taiwan).

"Test device for testing on-chip clock controller having debug function" was invented by Sheng-Ping Yung (Hsinchu, Taiwan) and Pei-Ying Hsueh (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device is configured to test an on-chip clock controller having a debug function. The test device includes a scan chain and a test circuit. The scan chain includes N flip-flop circuit(s), each of which stores a first input signal as a storage signal, then stores a second input signal as the storage signal or keeps the current storage signal according to an ...