US Patent Issued to REALTEK SEMICONDUCTOR on June 3 for "Measuring system and associated method" (Taiwanese Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,323,194, issued on June 3, was assigned to REALTEK SEMICONDUCTOR Corp. (Hsinchu, Taiwan).

"Measuring system and associated method" was invented by Ming-Chung Huang (Hsinchu, Taiwan) and Hsiang-Chen Kuo (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The application discloses a measuring system and associated method for measuring phases of IMD3 signals generated from a power amplifier. The method includes: performing a phase estimation process, including a plurality of sub-processes, wherein each sub-process includes: generating a first main signal, a second main signal, a first adjustable signal, wherein frequencies of the first main sign...