US Patent Issued to Realtek Semiconductor on Jan. 28 for "Test circuit and method for reading data from a memory device during memory dump" (Taiwanese Inventors)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,211,570, issued on Jan. 28, was assigned to Realtek Semiconductor Corp. (HsinChu, Taiwan).

"Test circuit and method for reading data from a memory device during memory dump" was invented by Li-Wei Deng (HsinChu, Taiwan), Ying-Yen Chen (HsinChu, Taiwan) and Chih-Tung Chen (HsinChu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test circuit coupled to a memory device and configured to read data stored in the memory device during a memory dump, includes a dump controller and a pattern generator. The dump controller triggers the pattern generator to start a pattern generating operation in response to a setting of memory dump mode by a processor. T...