US Patent Issued to REALTEK SEMICONDUCTOR on Jan. 27 for "Method for testing power leakage of circuit and processing system using same" (Taiwanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,536, issued on Jan. 27, was assigned to REALTEK SEMICONDUCTOR CORP. (Hsinchu, Taiwan).

"Method for testing power leakage of circuit and processing system using same" was invented by Meng-Jung Lee (Hsinchu, Taiwan) and Yu-Lan Lo (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing system is adapted to execute a method for testing power leakage of a circuit. The method includes: obtaining a plurality of undefined nets according to a netlist and power mode information; obtaining a trace path according to the undefined nets and the power mode information; and determining whether there is a risk of power leakage in the trace path,...