US Patent Issued to REALTEK SEMICONDUCTOR on Feb. 25 for "Linearity test system, linearity signal providing device, and linearity test method" (Taiwanese Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,238,196, issued on Feb. 25, was assigned to REALTEK SEMICONDUCTOR CORP. (Hsinchu, Taiwan).

"Linearity test system, linearity signal providing device, and linearity test method" was invented by Meng-Che Li (Hsinchu, Taiwan) and Bo-Kai Huang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A linearity test system for a chip, a linearity signal providing device, and a linearity test method for the chip are provided. The linearity test method for the chip includes steps as follows: providing a reference clock signal and a receiver input signal to a chip under test, wherein the reference clock signal and the receiver input signal have a phase ...