US Patent Issued to Realtek Semiconductor on Dec. 30 for "Scan clock gating controller and method for performing stuck-at fault test among multiple block circuits" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,595, issued on Dec. 30, was assigned to Realtek Semiconductor Corp. (HsinChu, Taiwan).

"Scan clock gating controller and method for performing stuck-at fault test among multiple block circuits" was invented by Dong-Zhen Li (HsinChu, Taiwan) and Ying-Yen Chen (HsinChu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan clock gating controller and a method for performing a stuck-at fault test among multiple block circuits are provided. The scan clock gating controller includes a decoder and multiple clock gating circuits. The decoder is configured to generate multiple one-hot control signals according to a selection signal. The multiple cloc...