US Patent Issued to REALTEK SEMICONDUCTOR on Dec. 16 for "High-speed low-distortion envelope detector and method thereof" (California Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,500,561, issued on Dec. 16, was assigned to REALTEK SEMICONDUCTOR CORP. (Hsinchu, Taiwan).

"High-speed low-distortion envelope detector and method thereof" was invented by Chia-Liang (Leon) Lin (Fremont, Calif.) and Ting-Hsu Chien (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of envelope detection operates by receiving a RF (radio frequency) signal having a first voltage at a first node and a second voltage at a second node; using a common-mode source-follower (CMSF) having a first source follower and a second source follower connected in parallel and configured to receive the first voltage and the second voltage, respectivel...