ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,695, issued on Aug. 12, was assigned to REALTEK SEMICONDUCTOR CORP. (Hsinchu, Taiwan).
"Method for scanning bad block of memory and circuit system thereof" was invented by Fu-Ching Hsu (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for scanning bad block of a memory and a circuit system thereof are provided. In a procedure of scanning bad blocks of the memory, the circuit system uses a cache read command that is adapted to a process of continuously reading a plurality of memory pages of the memory. The cache read command loads a memory page data to a cache of the memory in advance, and then reads the memory page data from t...