US Patent Issued to RDA MICROELECTRONICS (BEIJING) on Dec. 9 for "Amplitude offset calibration method, device, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,806, issued on Dec. 9, was assigned to RDA MICROELECTRONICS (BEIJING) Co. LTD. (Beijing).

"Amplitude offset calibration method, device, and storage medium" was invented by Yifu Luan (Beijing), Kai Li (Beijing), Liyun Luo (Beijing) and Lichao Hu (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides an amplitude offset calibration method. The method includes: obtaining at least two test feedback signals, where the test feedback signals are analog signals obtained by a transmitter in a test mode according to a test signal, at least two test signals in one-to-one correspondence to the at least two test feedback signals a...