US Patent Issued to Raytheon on Sept. 30 for "Interface built in test failure detection apparatus" (Colorado, California Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,518, issued on Sept. 30, was assigned to Raytheon Co. (Tewksbury, Mass.).

"Interface built in test failure detection apparatus" was invented by Micky Harris (Lompoc, Calif.) and Magathi J. Willis (Broomfield, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An interface BIT failure detection circuit includes a sequencing circuit and a multiplexer. The sequencing circuit configured to generate the sequence selection signal. The multiplexer is in signal communication with the sequencing circuit, and includes a plurality of interface input. Each interface input corresponds to an interface of a device under test. The sequence selection signal is co...