ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,348, issued on Oct. 28, was assigned to Raytheon Co. (Arlington, Va.).
"Antenna array calibration device and method" was invented by Patrick J. Makridakis (Mendon, Mass.), Jack J. Schuss (Newton, Mass.), Thomas V. Sikina (Acton, Mass.) and Joseph E. Hilliard Jr. (Lawrence, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Described herein is an apparatus and a method for an antenna array calibration device and method. The device comprises a radio frequency/optical (RF/optical) data center having at least one optical input/output; N single mode fibers (SMF) each having a proximal end connected to the at least one optical input/output of the RF/opt...