US Patent Issued to Raytheon on Dec. 23 for "Flatness testing for cathodes" (Massachusetts Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,266, issued on Dec. 23, was assigned to Raytheon Co. (Arlington, Va.).

"Flatness testing for cathodes" was invented by Joaquim A. Bento (Marlborough, Mass.) and Mark J. Beaulieu (Sutton, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for testing flatness includes a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture. A gimbal is slidingly engaged to the main fixture to slide in a direction along the longitudinal axis. A biasing member is axially between the base and the gimbal. Three rotating arms are mounted to the testing end of the main fixture. Th...