ALEXANDRIA, Va., July 9 -- United States Patent no. 12,355,652, issued on July 8, was assigned to RAKUTEN SYMPHONY INC. (Tokyo).
"Functional testing of NF device" was invented by Sandeep Bagchi (Bangalore, India) and Nayan Sen (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments herein disclose an electronic device for performing functional testing of a NF device. A processor is configured to receive a specification corresponding to a service to be tested on a DUT and generate a proto file based on the specification, where the proto file comprises a plurality of messages and definitions associated with a plurality of RPCs for enabling communication with a test harness manager. The pro...