US Patent Issued to QUANTUM TECHNOLOGIES, ELMOS SEMICONDUCTOR on Sept. 9 for "Methods and apparatuses for measuring magnetic flux density and other parameters by means of a plurality of NV centers, and applications thereof" (German Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,025, issued on Sept. 9, was assigned to QUANTUM TECHNOLOGIES GMBH (Leipzig, Germany) and ELMOS SEMICONDUCTOR SE (Dortmund, Germany).

"Methods and apparatuses for measuring magnetic flux density and other parameters by means of a plurality of NV centers, and applications thereof" was invented by Bernd Burchard (Essen, Germany) and Jan Meijer (Bochum, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sensor system includes a quantum dot including one or more paramagnetic centers. It comprises a control and evaluation device including a pump radiation source, a radiation receiver and which irradiates the quantum dot depending on a transmission ...