ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,696, issued on May 27, was assigned to QUANTA COMPUTER INC. (Taoyuan, Taiwan).
"Test load circuit" was invented by Kuo-Chan Hsu (Taoyuan, Taiwan), Yun-Teng Shih (Taoyuan, Taiwan) and Chia-Wei Lee (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test load circuit includes a test load, a current sensor, and comparator. The test load is connected to a voltage source of a power supply. The current sensor is configured to detect the amount of current flowing through the test load. The comparator has a first input connected to a feedback signal having a voltage associated with the test load current, a second input connected to a command s...