US Patent Issued to QUALCOMM on Sept. 30 for "Bit-length control for linear regression-based affine merge candidate derivation" (California Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,432,352, issued on Sept. 30, was assigned to QUALCOMM Inc. (San Diego).

"Bit-length control for linear regression-based affine merge candidate derivation" was invented by Yan Zhang (San Diego), Han Huang (San Diego), Vadim Seregin (San Diego) and Marta Karczewicz (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example device for coding video data includes memory configured to store the video data and one or more processors communicatively coupled to the memory. The one or more processors are configured to reduce a bit length of one or more input variables for a linear regression operation to generate one or more reduced bit length input va...