US Patent Issued to QUALCOMM on Sept. 23 for "Multiple-input multiple-output over the air performance testing" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,110, issued on Sept. 23, was assigned to QUALCOMM Inc. (San Diego).

"Multiple-input multiple-output over the air performance testing" was invented by Bin Han (Beijing), Yiqing Cao (Beijing) and Yan Li (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a testing equipment may transmit a set of test signals to a device under test (DUT) from a plurality of directions relative to the DUT; obtain, from the DUT, a set of measured multiple-input multiple-output (MIMO) sensitivity results based at least in part on the set of test signals; and determi...