US Patent Issued to QUALCOMM on Sept. 23 for "Measurement gaps for L1 measurements" (California, Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,425,910, issued on Sept. 23, was assigned to QUALCOMM Inc. (San Diego).

"Measurement gaps for L1 measurements" was invented by Prashant Sharma (San Jose, Calif.), Changhwan Park (San Diego), Muhammad Nazmul Islam (Littleton, Mass.) and Jing Lei (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure provides systems, methods and apparatus, including computer programs encoded on computer storage media for a user equipment (UE), which may include a reduced capability (RedCap) UE, and a supporting cell. The UE may receive a synchronization signal block (SSB). The UE may receive a configuration of an active downlink bandwidth part (BWP) t...