US Patent Issued to QUALCOMM on Sept. 16 for "Automated damage condition detection and data backup in an electronic device" (Indian Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,189, issued on Sept. 16, was assigned to QUALCOMM Inc. (San Diego).

"Automated damage condition detection and data backup in an electronic device" was invented by Hari Krishna Munagala (Giddalur, India), Ravinder Are (Hyderabad, India), Rajeevalochana R (Hyderabad, India), Utkarsh Verma (Lucknow, India), Praveen Kandukuri (Chilakaluripet, India) and Hargovind Prasad Bansal (Bharatpur, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure provides systems, methods, and devices for memory systems that support automatic backup of data upon detection of a potential damage condition. In a first aspect, a method includes detecting, by at l...