US Patent Issued to QUALCOMM on Oct. 28 for "Wireless node self-interference measurements and uplink beam management for full duplex transmissions" (New Jersey, California, Pennsylvania Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,029, issued on Oct. 28, was assigned to QUALCOMM Inc. (San Diego).

"Wireless node self-interference measurements and uplink beam management for full duplex transmissions" was invented by Qian Zhang (Basking Ridge, N.J.), Yan Zhou (San Diego), Navid Abedini (Basking Ridge, N.J.), Tao Luo (San Diego) and Junyi Li (Fairless Hills, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a first wireless node may determine, from a plurality of beams associated with the first wireless node, a set of suitable uplink beams and a set of suitable downlink beams, ...