US Patent Issued to QUALCOMM on Oct. 28 for "Analog-to-digital converter with built-in charge-based capacitance measurements" (Washington Inventor)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,986, issued on Oct. 28, was assigned to QUALCOMM Inc. (San Diego).

"Analog-to-digital converter with built-in charge-based capacitance measurements" was invented by Xiaopeng Zhong (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ADC with built-in charge-based capacitance measurements is described. An example includes a plurality of capacitors coupled in parallel to an input voltage at a common node, a plurality of drivers each coupled to a respective capacitor opposite the common node, a first switch coupled to the common node to couple the common node to a ground in response to a second clock signal from a timing generator, a second switc...