ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,463,697, issued on Nov. 4, was assigned to QUALCOMM Inc. (San Diego).
"Interference measurement for sidelink" was invented by Gabi Sarkis (San Diego), Wanshi Chen (San Diego), Alexandros Manolakos (Escondido, Calif.) and Sudhir Kumar Baghel (Pleasanton, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects relate to mechanisms for measuring the interference on the sidelink for use in calculating the channel quality indicator (CQI) in channel state information (CSI) reporting. Channel state information-interference measurement (CSI-IM) resources on which a sidelink device may measure the interference may be located outside of a bandwidth allocated...