ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,466,412, issued on Nov. 11, was assigned to QUALCOMM Inc. (San Diego).
"Yaw rate sensor bias estimation" was invented by William Jay Young (Rochester, Mich.), Amol Rajendra Birhade (Jersey City, N.J.), Jason Gregory Pickel (Farmington Hills, Mich.), Jose Carlos Zavala-Jurado (Brighton, Mich.) and Yimeng Dong (Northville, Mich.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An example yaw rate related method includes: obtaining a plurality of measurements of yaw rate of a vehicle from a yaw rate sensor; and determining a yaw rate sensor bias estimate for the yaw rate sensor based on at least one of the plurality of measurements of yaw rate in response to...