ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,470,347, issued on Nov. 11, was assigned to QUALCOMM Inc. (San Diego).
"Low-layer positioning measurement reporting" was invented by Srinivas Yerramalli (San Diego), Alexandros Manolakos (Escondido, Calif.), Mukesh Kumar (Hyderabad, India) and Mohammad Tarek Fahim (San Diego).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of sending measurement information from a user equipment includes: measuring a reference signal: producing a measurement report payload based on measurement of the reference signal: encoding the measurement report pay load in accordance with ASN.1 (Abstract Syntax Notation One) encoding, and in accordance with a lower-layer pro...