US Patent Issued to QUALCOMM on June 24 for "Reporting model parameter information for layer 1 measurement prediction" (California Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,342,202, issued on June 24, was assigned to QUALCOMM Inc. (San Diego).

"Reporting model parameter information for layer 1 measurement prediction" was invented by Iyab Issam Sakhnini (San Diego) and Tao Luo (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive configuration information that includes a rule for transmitting model parameter information associated with a model for predicting a Layer 1 (L1) measurement or for transmitting a combination of the model parameter information and an L1 measurement report. The...