US Patent Issued to QUALCOMM on June 17 for "Slot format for intra-frequency cross link interference measurement" (Chinese, American Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,335,988, issued on June 17, was assigned to QUALCOMM Inc. (San Diego).

"Slot format for intra-frequency cross link interference measurement" was invented by Ruifeng Ma (Beijing) and Huilin Xu (Temecula, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. A user equipment (UE) may receive control signaling indicating a resource for measuring cross link interference (CLI). The UE may determine that the resource overlaps with (e.g., at least partially overlaps) one or more symbols or a transmission occasion. The UE may determine, according to what the resource overlaps with, whether...