US Patent Issued to QUALCOMM on June 10 for "Memory with scan chain testing of column redundancy logic and multiplexing" (Indian, American Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,327,599, issued on June 10, was assigned to QUALCOMM Inc. (San Diego).

"Memory with scan chain testing of column redundancy logic and multiplexing" was invented by Rahul Sahu (Bangalore, India), Sharad Kumar Gupta (Bangalore, India), Jung Pill Kim (San Diego), Chulmin Jung (San Diego) and Jais Abraham (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory is provided in which a scan chain covers the redundancy logic for column redundancy as well as the redundancy multiplexers in each column. The redundancy logic includes a plurality of redundancy logic circuits arranged in series. Each redundancy logic circuit corresponds to a respect...