US Patent Issued to QUALCOMM on July 8 for "Self-interference measurement report" (New Jersey, California, Pennsylvania Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,356,395, issued on July 8, was assigned to QUALCOMM Inc. (San Diego).

"Self-interference measurement report" was invented by Qian Zhang (Basking Ridge, N.J.), Yan Zhou (San Diego), Navid Abedini (Basking Ridge, N.J.), Tao Luo (San Diego) and Junyi Li (Fairless Hills, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The UE in a FD operation may receive scheduling information including timing information for reporting a self-interference measurement, and transmit a self-interference measurement report including the self-interference measurement based on the scheduling information received from a network node. The UE may transmit a request for the self-in...