ALEXANDRIA, Va., July 30 -- United States Patent no. 12,373,291, issued on July 29, was assigned to QUALCOMM Inc. (San Diego).
"Transient fault detection in memory using dynamic BIST" was invented by Sateeshkumar Injarapu (Bangalore, India), Amit Duggal (Bangalore, India), Manish Kumar Saxena (Bangalore, India) and Nitin Jaiswal (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for managing a plurality of imaging devices in a vehicle includes determining that a change of data security mode is indicated for frames of image data transmitted over a first data communication link, determining whether a sensor management system has sufficient processing capacity to support the change of dat...