ALEXANDRIA, Va., July 16 -- United States Patent no. 12,363,568, issued on July 15, was assigned to QUALCOMM Inc. (San Diego).
"Beam measurement reporting for spatially offset beams" was invented by Shay Landis (Hod Hasharon, Israel), Idan Michael Horn (Hod Hasharon, Israel) and Yehonatan Dallal (Kfar Saba, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. In some wireless communications systems, a user equipment (UE) may receive reference signals for a UE beam measurement procedure for measuring a set of network transmit beams corresponding to the set of reference signals. The UE may transmit a measurement report indicating measure...