US Patent Issued to QUALCOMM on Jan. 27 for "Measurement of sounding reference signal reflections off of reconfigurable intelligent surfaces" (American, Chinese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,538,264, issued on Jan. 27, was assigned to QUALCOMM Inc. (San Diego).

"Measurement of sounding reference signal reflections off of reconfigurable intelligent surfaces" was invented by Weimin Duan (San Diego), Huilin Xu (Temecula, Calif.) and Yuwei Ren (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are techniques for communication. In an aspect, a wireless node (e.g., UE or BS) measures a first TOA of a first SRS-P from a UE, a second TOA of a reflection of a second SRS-P from the UE off of a first RIS, and a third TOA of a reflection of a third SRS-P from the UE off of a second RIS. The UE transmits, to a position estimation entity, ...