US Patent Issued to QUALCOMM on Jan. 27 for "Increased angle of departure measurement granularity" (California Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,538,258, issued on Jan. 27, was assigned to QUALCOMM Inc. (San Diego).

"Increased angle of departure measurement granularity" was invented by Alexandros Manolakos (Escondido, Calif.), Weimin Duan (San Diego), Jay Kumar Sundararajan (San Diego), Wanshi Chen (San Diego), Krishna Kiran Mukkavilli (San Diego) and Tingfang Ji (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are techniques for wireless communication. In an aspect, a receiving entity (RE), e.g., a user equipment or base station, receives a positioning resource beam configuration that defines a set of positioning resources, each positioning resource being transmitted by a tra...