US Patent Issued to QUALCOMM on Jan. 13 for "Enhanced beam failure detection for candidate cells" (California, New Jersey, Pennsylvania Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,670, issued on Jan. 13, was assigned to QUALCOMM Inc. (San Diego).

"Enhanced beam failure detection for candidate cells" was invented by Tianyang Bai (Somerville, N.J.), Yan Zhou (San Diego) and Junyi Li (Fairless Hills, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are systems and techniques for wireless communications. For instance, a process may include receiving an indication to monitor one or more beam failure detection reference signals (BFD RSs) from a set of cells, wherein the set of cells includes a first candidate cell, monitoring the one or more BFD RSs from the set of cells, detecting a beam failure from a cell of the set ...