US Patent Issued to QUALCOMM on Dec. 30 for "Optimized way to validate the NTN cell" (Indian Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,642, issued on Dec. 30, was assigned to QUALCOMM Inc. (San Diego).

"Optimized way to validate the NTN cell" was invented by Ravi Kanth Kotreka (Hyderabad, India), Rajan Kumar (Hyderabad, India) and Pankaj Bansal (Hyderabad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A UE may identify an offset period associated with an NTN cell based on a SIB. The UE may identify a TA value associated with the NTN cell for the UE based on a location of the UE and a location of a satellite of the NTN cell. The UE may identify whether the TA value associated with the NTN cell for the UE is less than the offset period associated with the NTN cell. The UE may ...