US Patent Issued to QUALCOMM on Dec. 2 for "Enhanced minimization of drive test (MDT) framework" (American, Indian Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,490,117, issued on Dec. 2, was assigned to QUALCOMM Inc. (San Diego).

"Enhanced minimization of drive test (MDT) framework" was invented by Hargovind Prasad Bansal (Hyderabad, India) and Tom Chin (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method performed by a user equipment (UE) includes receiving a logging measurement message having a logging measurement configuration from a base station. The method also initiates a minimization of drive test (MDT) session in response to receiving the logging measurement message. The method further determines a status of a UE component and selects a set of logged measurement types from a number of logg...