US Patent Issued to QUALCOMM on Aug. 26 for "Techniques for autonomous self-interference measurements" (New Jersey, California Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,402,024, issued on Aug. 26, was assigned to QUALCOMM Inc. (San Diego).

"Techniques for autonomous self-interference measurements" was invented by Qian Zhang (Basking Ridge, N.J.), Yan Zhou (San Diego), Navid Abedini (Basking Ridge, N.J.), Junyi Li (Fairless Hills, N.J.) and Tao Luo (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain aspects of the present disclosure provide techniques for user equipment-based autonomous self-interference measurement. An example method includes transmitting at least one uplink (UL) transmission using at least one UL transmit beam, performing self-interference measurements using at least one downlink (DL) re...