US Patent Issued to QUALCOMM on Aug. 19 for "Determining a beam failure instance count for beam failure detection" (California Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,395,866, issued on Aug. 19, was assigned to QUALCOMM Inc. (San Diego).

"Determining a beam failure instance count for beam failure detection" was invented by Shanyu Zhou (San Diego), Jelena Damnjanovic (Del Mar, Calif.) and Tao Luo (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive, from a base station, a beam failure detection reference signal (BFD-RS). The UE may determine, autonomously at the UE based at least in part on the BFD-RS, a beam failure instance (BFI) count for different types of BFI including BFI ...