ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,389,254, issued on Aug. 12, was assigned to QUALCOMM Inc. (San Diego).
"Layer 1 measurement reporting using measurement index" was invented by Iyab Issam Sakhnini (San Diego), Tao Luo (San Diego), Qiang Wu (San Diego), Wooseok Nam (San Diego), Yan Zhou (San Diego), Juan Montojo (San Diego) and Wanshi Chen (San Diego).
According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment may generate a Layer 1 measurement report identifying one or more measurements by corresponding measurement indices, refrain from including a measurement value in the Layer 1 m...