ALEXANDRIA, Va., April 9 -- United States Patent no. 12,273,175, issued on April 8, was assigned to QUALCOMM Inc. (San Diego).
"Beam quality measurements in wireless networks" was invented by Huilin Xu (Temecula, Calif.), Alexandros Manolakos (Escondido, Calif.), Weimin Duan (San Diego), June Namgoong (San Diego) and Muhammad Sayed Khairy Abdelghaffar (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects relate to measuring downlink beam quality in the presence of self-interference when operating in a full duplex mode configured for concurrent transmission and reception within an overlapping bandwidth. A user equipment (UE) may communicate with a base station over one or more of a pluralit...