US Patent Issued to QUALCOMM on April 29 for "Quality of experience measurement and reporting" (California Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,289,642, issued on April 29, was assigned to QUALCOMM Inc. (San Diego).

"Quality of experience measurement and reporting" was invented by Shankar Krishnan (Poway, Calif.), Xipeng Zhu (San Diego), Rajeev Kumar (San Diego) and Gavin Bernard Horn (La Jolla, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. A user equipment (UE) may measure quality of experience (QoE) metrics and transmit a QoE report that is formatted to be readable by a base station, such that a base station may receive the QoE report and independently perform adjustments associated with the service being utilized...