ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,972, issued on Nov. 11, was assigned to Qorvo US Inc. (Greensboro, N.C.).
"Scan test in a single-wire bus circuit" was invented by Alexander Wayne Hietala (Phoenix), Christopher Truong Ngo (Queen Creek, Ariz.) and Ryan Lee Bunch (Greensboro, N.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A Scan test in a single-wire bus circuit is described in the present disclosure. The single-wire bus circuit has only one external pin for connecting to a single-wire bus. Given that multiple physical pins are required to carry out the Scan test, the single-wire bus circuit must provide additional pins required by the Scan test. In embodiments disclosed herein,...