US Patent Issued to Qeexo on Oct. 28 for "Automated machine vision-based defect detection" (Pennsylvania, California Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,185, issued on Oct. 28, was assigned to Qeexo Co. (San Jose, Calif.).

"Automated machine vision-based defect detection" was invented by Rajen Bhatt (McDonald, Pa.), Shitong Mao (Pittsburgh), Raviprakash Kandury (Cupertino, Calif.), Michelle Tai (Fremont, Calif.) and Geoffrey Newman (Pittsburgh).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix r...