US Patent Issued to QEATECH on June 3 for "Method and system for detection and localization of thermal defects" (Canadian Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,078, issued on June 3, was assigned to QEATECH INC. (Markham, Canada).

"Method and system for detection and localization of thermal defects" was invented by Mansour Asrani (Toronto), Peyvand Melati Rad (Markham, Canada) and Omid Alaei (Thornhill, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and associated method for thermal inspection of structures. The method includes providing an unmanned aerial vehicle ("UAV"), the UAV comprising a thermal camera for capturing thermal image data, a visible light camera for capturing visible light image data, and a positioning system for capturing positioning data, operating the UAV by flying the ...