ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,219,117, issued on Feb. 4, was assigned to Qcify Inc. (San Mateo, Calif.).
"Automated sample weight measurement via optical inspection" was invented by Raf Peeters (San Mateo, Calif.), Antoon De Cleen (Diest, Belgium), Pieter Ieven (Genk, Belgium) and Ruben Praets (Leopoldsburg, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes the steps collecting measurement data of a sample utilizing an adaptable inspection unit or while the sample is in-flight, determining a volume or area of the sample based at least in part on the measurement data, and calculating a weight of the sample based at least in part on the volume or area of the samp...